POLARIZED XRF SPECTROMETER WITH A 40-mW X-RAY TUBE

Ryohei Tanaka, Tomohiro Sugino, Daisuke Yamashita, Naomi Shimura, Jun Kawai

Аннотация


A three-dimensional polarized X-ray fluorescence (XRF) spectrometer was assembled with a low-power X-ray tube of 40 milliwatts, and a sample of stainless steel was measured with an acrylic polarizer. Based on the Schrödinger’s wave picture of Compton scattering, the dependence of the de Broglie wavelength and the scattering angle of a recoil electron on the incident X-ray energy were calculated. When the incident X-rays were scattered at an angle of 90°, the de Broglie of the recoil electron always went away at an angle of 45° with the incident X-rays and the de Broglie wavelength varied for any wavelength of the incident X-rays, i.e. we could select the scattering angle of the recoil electron to be 45°according to the incident X-ray energy and it could then be regarded as 45° Bragg diffraction that could produce highly polarized X-rays. The polarization measurement of scattered X-rays from an acrylic and lead plates substantiated that Compton scattered X-rays from the acrylic plate had higher degree of polarization than the elastically scattered X-rays from the lead plate. Highly polarized Compton scattered X-rays from the light-element polarizer led to the background reduction and the changes of the characteristic X-ray intensity in XRF spectra measured by our laboratory-made spectrometer.

Key words: polarized X-ray fluorescence  spectrometer, stainless steel, acrylic polarizer, Compton scattering, background.

DOI: http://dx.doi.org/10.15826/analitika.2018.22.2.010

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REFERENCES

Ryon R.W. Polarization for background reduction in EDXRF - The technique that does indeed work, Advances in X-Ray Analysis, 2003, vol. 46, pp. 352-362.

Barkla C.G. Polarized Röntgen radiation, Philosophical Transactions of the Royal Society of London. Series A, Containing Papers of a Mathematical or Physical Character, 1905, vol. 204, pp. 467-479.

Standzenieks P., Lindgren E.S. Background reduction of X-ray fluorescence spectra in a secondary target energy dispersive spectrometer, Nuclear Instruments and Methods, 1979, vol. 165, pp. 63-65.

Champion K.P., Whittem R.N. Utilization of increased sensitivity of X-ray fluorescence spectrometry due to polarization of the background radiation, Nature, 1963, vol. 199, no. 4898, p. 1082. doi:10.1038/1991082a0

Young J.C., Vane R.A., Lenehan J.P. Background reduction by polarization in energy dispersive X-ray spectrometry, Western Regional Meeting of the American Chemical Society, San Diego, October 1973.

Dzubey T.G., Jarrett B.V., Jaklevic J.M. Background reduction in X-ray fluorescence spectra using polarization, Nuclear Instruments and Methods, 1973, vol. 115, no. 1, pp. 297-299.

Howell R.H., Pickles W.L., Cate jr. J.L. X-Ray Fluorescence Experiments with Polarized X-Rays, Advances in X-Ray Analysis, vol. 17 (Proceedings of the Twenty-Second Annual Conference on Applications of X-Ray Analysis held in Denver, August 22-24, 1973), 1974, pp. 265-277.

Ryon R.W. Polarized radiation produced by scatter for energy dispersive x-ray fluorescence trace analysis, Advances in X-Ray Analysis, 1977, vol. 20, pp. 575-590.

Ryon R.W., Zahrt J.D. Improved x-ray fluorescence capabilities by excitation with high intensity polarized x-rays, UCRL, 1978, 80937. Jul 1978; 15 p. 27 Conference on applications of x-ray analysis; Denver, CO, USA; 1-4 Aug 1978; CONF-780822-2. Available at: https://inis.iaea.org/search/search.aspx?orig_q=RN:10443911 (accessed 13 June 2018).

Kitov B.I. Spectrum function of polarizer-scattered x-ray tube radiation, X-ray spectrometry, 2005, vol. 34, pp. 52-55.

Swoboda W., Beckhoff B., Kanngieber B., Scheer J. Use of Al2O3 as a Barkla scatterer for the production of polarized excitation radiation in EDXRF, X-ray Spectrometry, 1993, vol. 22, pp. 317-322.

Revenko A. G., Revenko V. A., Khudonogov E.V., Zhalsaraev B. [X-ray fluorescent determination of Rb, Sr, Y, Zr, Nb, Sn, Ba, La, and Ce in rocks on an energy dispersion spectrometer with a polarizer], Analitika i Kontrol` (Analytics and Control), 2002, vol. 6, no. 4, pp. 400-407 (in Russian).

Panalytical: Epsilon-5. Available at: http://www.speciation.net/Database/Instruments/PANalytical-BV/Epsilon-5-;i1663 (accessed 13 June 2018).

Aiginger H., Wobrauschek P., Brauner C. Energy-dispersive fluorescence analysis using Bragg-reflected polarized X-rays, Nuclear Instruments and Methods, 1974, vol. 120, no. 3, pp. 541-542.

Tanaka. R., Akiba S., Kawai. J. X-Ray Fluorescence Intensity Using Polarization, Adv. X-Ray. Chem. Anal., Japan, 2017, vol. 48, pp. 352-356.

Guerra M., Alves M., Carvalho M. L., Pessanha S. Development of a portable EDXRF spectrometer with a secondary target in a tri-axial geometry, EXRS2016, Gothenburg, June 2016.

Pessanha S., Alves M., Sampaio J. M., Santos J. P., Carvalho M.L., Guerra M. A novel portable energy dispersive X-ray fluorescence spectrometer with triaxial geometry, Journal of Instruments, 2017, no. 12, pp. 01014-01027. doi: 10.1088/1748-0221/12/01/P01014.

Moxtek. X-ray Components. Available at: http://moxtek.com/x-ray-products (accessed 13 June 2018)

RES-Lab. Available at: http://www.res-lab.com (accessed 13 June 2018).

Hubbel J.H. Photon Cross-Sections, Attenuation Coefficients and Energy Absorption Coefficients from 10 keV to 100 GeV, National Bureau of Standards, 1969, 92 p. Available at: http://nvlpubs.nist.gov/nistpubs/Legacy/NSRDS/nbsnsrds29.pdf (accessed 13 June 2018).

Sasaki N., Okada K. and Kawai J. // X-ray tube spectral measurement method for quantitative analysis of X-ray fluorescence analysis，X-ray spectrometry, 2010, vol. 39, no. 5, pp. 328-331. doi: 10.1002/xrs.1271

Schrödinger E. // Über den Comptoneffekt, Annalen der Physik, 1927, vol. 82, pp. 257-264.

Landé A. Quantum Mechanics, New York, Pitman Publishing Corporation, 1951, pp. 15-18.

Kawai J. Quantum Spectrochemistry, 2008, 2015 - 2nd Ed., AGNE Gijutu Center, Tokyo, pp.10-23.

Tanaka. R. , Kawai. J. Polarizer for Continuous White X-Rays Using The de Broglie Wave of 45°-Recoil Electron via Compton Scattering, Adv. X-Ray. Chem. Anal., Japan, 2018, vol. 49, pp.189-194.


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