ИСПОЛЬЗОВАНИЕ ИНТЕНСИВНОСТИ РАССЕЯННОГО ВЕЩЕСТВОМ РЕНТГЕНОВСКОГО ИЗЛУЧЕНИЯ В ПРАКТИКЕ РЕНТГЕНОФЛУОРЕСЦЕНТНОГО АНАЛИЗА
Аннотация
Выполнен критический обзор опубликованных работ, посвященных теории и практике применения рассеянного первичного рентгеновского излучения веществом. Детально рассмотрены физические основы упругого и неупругого рассеяния рентгеновских фотонов атомами вещества. Сопоставлены результаты расчетов дифференциальных коэффициентов рассеяния с экспериментальными данными различных авторов. Показана необходимость учета вклада многократного рассеяния в интенсивность рассеянного излучения на образцах с малыми атомными номерами. Проведен анализ влияния аномального рассеяния на результаты рентгенофлуоресцентного анализа (РФА) и возможности его учета. Приведены примеры успешных попыток учета или компенсации изменения коэффициентов рассеяния образцов. Рассмотрены различные случаи использования рассеянного излучения в практике РФА с целью учета матричных эффектов и других трудноконтролируемых факторов. Продемонстрированы примеры эффективного и ограниченного использования рассеянного излучения в регрессионных уравнениях связи и способе теоретических поправок, а также нестандартного применения рассеянного излучения. Сделаны выводы и даны практические рекомендации.
Ключевые слова: рентгенофлуоресцентный анализ, рассеянное излучение, дифференциальные сечения когерентного и некогерентного рассеяния, аномальное рассеяние, межэлементные влияния.
DOI: http://dx.doi.org/10.15826/analitika.2014.18.1.001
Полный текст:
PDF (Russian)Литература
Blokhin M.A. Fizika rentgenovskikh luchei [Physics of X-rays]. Moscow, State publishing house of technical and theoretical literature, 1953. 455 p. (in Russian).
Plotnikov R.I., Pshenichnyi G.A. Fluorestsentnyi rentgenoradiometricheskii analiz [X-ray fluorescent radiometric analysis]. Moscow, Atomizdat, 1973. 264 p. (in Russian).
Dzheims R. Opticheskie printsipy difraktsii rentgenovskikh luchei [Optical principles of X-ray diffraction]. Moscow, IL, 1936. 572 p.
Pavlinskii G.V. Osnovy fiziki rentgenovskogo izlucheniia [Basic physics of X-rays]. Moscow, Fizmatlit, 2007. 240 p. (in Russian).
Kissel L., Pratt R.H., Roy S.C. Rayleigh scattered by neutral atoms, 100 eV to 10 MeV. Physics revue. A, 1980, vol. 22, no. 5, pp. 1970-2004.
Hubbell J.H., Veilgele W.J., Briggs E.A., Brown R.T, Cromer D.T., Howerton R.J. Atomic form factors, incoherent scattering functions, and photon scattering cross section. J. Phys. Chem. Ref. Data, 1975, vol. 4, no. 3, pp. 471-538.
Hubbell J.H., Overbo I. Relativistic atomic form factors and photon coherent scattering cross sections. J. Phys. Chem. Ref. Data, 1970, vol. 8, no. 1, pp. 69-105.
Podoliako S.V., Luk'ianova E.G. Chislennoe modelirovanie transformatsiia rentgenovskogo izlucheniia v ob"ektakh s uchetom vliianiia form-faktorov na uglovoe raspredelenie fotonov [The account of influence of form-factor on angular distribution of photons at numerical modeling transformations of X-ray radiation in objects]. Moscow, 2004. 19 p. (in Russian).
Pinsker Z.G. Dinamicheskoe rasseianie rentgenovskikh luchei v ideal'nykh kristallakh [Dynamic X-ray scattering in perfect crystals]. Moscow, Nauka, 1974. 368 p.
NIST X-Ray Form Factor, Attenuation and Scattering Tables (version 2.1). Available: http://physics.nist.gov/ffast [2008, April 26]. (accessed 5 February 2013).
Akkerman A.F., Nikitushev Iu.M., Botvin V.A. Reshenie metodom Monte-Karlo zadach perenosa bystrykh elektronov v veshchestv [The decision by the Monte Carlo transport problems fast electrons in matter]. Alma-Ata, Nauka, 1972. 163 p. (in Russian).
Dotsenko L.I., Klad'ko V.P. Dinamicheskoe rasseianie rentgenovskikh luchei real'nymi kristallami v oblasti anomal'nogo rasseianiia [Dynamic X-ray scattering by real crystals in anomalous scattering]. Kiev, Akademperiodika, 2000. 352 p. (in Russian).
Kissel L, Zhou B., Roy S.C., Gupta S.K.S. and Pratt R.H. Validity of Form-Factor, Modified-Form-Factor and Anomalous-Scattering-Factor Approximations in Elastic Scattering Calculations. Acta Crystallographica, 1995, A51, pp. 271-288. Available: http://physci.llnl.gov/Research/scattering/elastic.html.
Szaloki I. Empirical equation for atomic form factor and incoherent scatting functions. X-ray spectrometry, 1996, vol. 25, no.1, pp. 21-28.
Marenkov O.S., Komkov B.G., Jepshtejn M.Z. [Atomic form factors, taking into account dispersion corrections]. Apparatura i metody rentgenovskogo analiza [Equipment and techniques for X-ray analysis.], Leningrad, 1981, vol. 25, pp. 204-207. (in Russian).
Yalcin P., Kurucu Y., Sahin Y. Incoherent scattering function for some elements with 23 . X-ray spectrometry, 2002, vol. 31, no.1, pp. 100-102.
Rao D.V., Cesareo R., Gigante G.E. Elastic scattering and associated anomalous dispersion in the energy range keV from heavy atoms. X-ray spectrometry, 1998, vol. 27, no. 6, pp. 381-389.
Takeda T., Itai Y., Akatsuka T., Cesareo R., Brunetti A., Gigaante G.E. X-ray scattering cross section for molecules plastics, tissues and few biological materials. J. Trace and microprobe technique, 2002, vol. 20, no. 3, pp. 327-361.
Simsek O., Ertugrul M., Budak G., Karabulut A. Inelastic and elastic scattering differential cross-section of 59,5 keV photons Cu and Zn targets. X-ray spectrometry, 2004, vol. 33, no. 6, pp. 349-353.
Poletti M.E., Goncalves O.D., Mazzaro I. Coherent and incoherent scattering of 17,44 and 6,93 keV X-ray photons scattered from biological and biological-equivalent samples: characterization of tissues. X-ray spectrometry, 2002, vol. 31, no. 1, pp. 57-61.
Marenkov O.S., Zverev A.I. [The differential coefficients of coherent scattering of X-ray and gamma - radiation in the anomalous dispersion region]. Apparatura i Metody Rrentgenovskogo Analiza [Equipment and techniques for X-ray analysis], Leningrad, 1987, no. 31, pp. 111-113 (in Russian).
Van Gysel M., Lemberger P., Espen P.Van. Description of Compton peaks in energy – dispersive X-ray fluorescence spectra. X-ray spectrometry, 2003, vol. 32, no. 2. pp. 139-147.
Bakhtiarov A.V., Chernoberezhskaia S.A. [X-ray scattering coefficients] Apparatura i Metody Rrentgenovskogo Analiza [Equipment and techniques for X-ray analysis], Leningrad, 1972, no. 11, pp. 200-218 (in Russian).
Marenkov O.S., Epshtein M.Z. [Program for calculating differential and integral cross sections for coherent and incoherent scattering of X-ray and gamma – quanta] Apparatura i Metody Rrentgenovskogo Analiza [Equipment and techniques for X-ray analysis], Leningrad, 1979, no. 22, pp. 175-176 (in Russian).
Roy S.C. Elastic scattering of photons: Perspectives and present status. X-ray spectrometry, 1999, vol. 28, pp. 376-378.
Blokhin M.A., Shveitser I.G. Rentgenospektral'nyi spravochnik [X-ray directory]. Moscow, Nauka. 1982. 374 p. (in Russian).
Konev A.V., Grigor'ev E.V., Astakhova N.A., Sukhovol'skaia N.A., Rubtsova S.N., Smagunova A.N. [Choice of optimal conditions of X-ray determination of elements with high atomic numbers and middle-way standard background]. Zhurnal analiticheskoi khimii [Journal of Analytical Chemistry], 1984, vol. 39, no. 4, pp. 599-605 (in Russian).
Bakhtiarov A.V. Rentgenospektral'nyi analiz v geologii i geokhimii [X-ray analysis in geology and geochemistry]. Leningrad, Nedra, 1985. 144 p. (in Russian).
Duimakaev Sh.I., Tsvetianskii A.L. [X-ray fluorescence analysis of heterogeneous materials-standard way to research the background jump scattering intensity near the absorption edge of the element]. Trudy Simpoziuma “Atomnaia spektroskopiia i spektral'nyi analiz [Proc. Symp. “Atomic spectroscopy and spectral analysis]. Kiev, 1975, pp. 22-23 (in Russian).
Bakhtiarov A.V., Pshenichnyi G.A. [Formulas for the approximate calculation of the differential cross sections of low-energy X-rays] Apparatura i Metody Rrentgenovskogo Analiza [Equipment and techniques for X-ray analysis], Leningrad, 1973, no. 12, pp. 68-72 (in Russian).
Tsvetyanskii A.L. Uchet vliianiia neizmeriaemykh komponentov i trudnokontroliruemykh faktorov na rezul'taty rentgenofluorestsentnogo analiza. Diss. dokt. fiz.-mat. nauk [Accounting for the effect of unmeasured components and unmanageable factors on the XRF results. Dr. phys. and math. sci. diss.]. Rostov-on-Don, 2010. 226 p. (in Russian).
Beda A.G., Lipkin I.M. [Observation of anomalous energy dependence of the cross section of Rayleigh scattering γ-radiation]. Izvestiia AN SSSR, seriia fizicheskaia [Proceedings of the USSR, physical series], 1980, no. 1, pp. 163-167 (in Russian)
Cromer D.T., Mann J.B. X-ray scattering factors computer from numerical Hartre-Fock wave functions. Acta crystallographica. Cection A, 1968, vol. 24, no. 2, pp. 321-324.
Goncalves O.D., Magalhaes S.D. Accurate Rayleigh differential cross-sections for 60 keV photons. The Ag case. Radiation Physics and Chemistry, 2000, no. 59, pp. 201-209.
Kumar A., Shahia J.S., Purib S., Mehtaa D., Singh N. Differential cross-section measurements for inelastic scattering of 22.1 keV photons by elements with 4 Z Nuclear Instruments and Methods in Physics Research B, 2002, no. 194, pp. 99-104.
Shahi J.S., Kumar A., Mehta D., Puri S., Garg M.L., Singh N. Inelastic scattering of 59,5 keV photons by elements with 13≤Z≤82. Nuclear Instruments and Methods in Physics Research B, 2001, vol. 179, pp. 15-23.
Boke Aysun. The total incoherent scattering cross section for low Z elements. Radiation physics and chemistry, 2013, no. 83, pp. 34-41.
Zubavichus Ia.V., Slovokhotov Iu.D. [X-ray synchrotron radiation in physicochemical studies]. Uspekhi khimii [Successes chemistry], 2001, vol. 70, no.5, pp. 430-463 (in Russian)
Kaminskii E.Iu. Rentgenospektral'nyi fluorestsentnyi mnogokomponentnyi analiz prob zhelezomargantsevykh konkretsii v sudovykh usloviiakh. Avtoref. diss. kand. tekh. nauk [X-ray fluorescence analysis of multicomponent samples of ferromanganese nodules in the marine environment. Author’s abstract of Ph.D. sci. diss.]. Sankt-Peterburg, 2000. 20 p. (in Russian)
Plesch R. Die verbesserung rontgenanalytischer ergebnisse durch eine modifizierte streustrahlungs-quotienten-methode. Microchimical Acta. 1976, no. 2, pp. 429-441
Mamikonian S.V. Apparatura i metody fluorestsentnogo rentgenoradiometricheskogo analiza [Apparatus and methods for fluorescent X-ray radiometric analysis]. Moscow, Atomizdat, 1976. 278 p. (in Russian)
Bao S.X. A power function relation between mass attenuation coefficient and Rh Compton peak Intensity and its application to XRF analysis. X-ray spectrometry, 1997, vol. 26, pp. 23-27.
Franzini M., Leony L., Saitta M. Determination of the X-ray mass absorption coefficient by measurement of the intensity of Compton scattered Radiation. X-ray spectrometry, 1976, vol 5, no. 3, pp. 84-87.
De Long S.E., McCullough D. Compton scattered tungsten X-rays as measure of mass absorption coefficients in rocks. American mineralogist, 1973, vol. 58, pp. 1073-1075.
Plesch R. Hilfsmethoden der matrixkorrektur in der rontgen spe ktrometrie. Fresenius Z. anal.chem., 1980, vol. 302, no. 5, pp. 393-397.
George R., Schiekel M. Application limits in using backscattered radiation for matrix correction in X-ray fluorescence analysis. Journal of radioanalytical Chemistry, 1983, vol. 79, no. 2, pp. 233-243.
Reynolds R.C. Jr. Matrix corrections in trace element analysis by X-ray fluoresce: estimation of the mass absorption coefficient by Compton scattering. American Mineralogis, 1963, vol. 48, no. 9-10, pp. 273-276.
Bao S.X. Absorption correction method based on the power function of continuous scattered radiation. X-ray spectrometry, 1998, vol. 27, no. 1, pp. 332-336.
Harvey P.K., Atkin B.P. The estimation of mass absorption coefficients: extensions to the use of Rh Compton radiation and intensity ratios. American Mineralogist, 1982, vol. 67, no. 5-6, pp. 534-537.
Tsvetianskii A.L., Baeva E.P., Duimakaev Sh.I. [For the dependence of the intensity ratio of coherent and incoherent scattered radiation on the value of the mass of the scattering coefficient of the sample]. Apparatura i Metody Rrentgenovskogo Analiza [Equipment and techniques for X-ray analysis], Leningrad, 1981, no. 26, pp. 68-72 (in Russian).
Leman E.P. Rentgenoradiometricheskii metod oprobovaniia mestorozhdenii tsvetnykh i chernykh metallov [X-ray radiometric method of testing fields of ferrous and nonferrous metals]. Leningrad, Nedra, 1978. 231 p. (in Russian)
Wolf S.J. Matrix determination with scattered tube lines. X-ray spectrometry, 1997, vol. 26, pp. 85-91.
Rekhkolainen G.I. [Investigation of the scattered X-rays in the L-fluorescence spectrum of rare earth elements]. Apparatura i Metody Rrentgenovskogo Analiza [Equipment and techniques for X-ray analysis], Leningrad, 1972, no. 10, pp. 89-94 (in Russian).
Celik A, Cevik U., Bacaksiz E. and Celik N. Effective atomic numbers and electron densities of CuGaSe2 semiconductor in the energy range 5-511 KeV. X-ray spectrometry, 2008, vol. 37, pp. 490-494
Losev N.F. Kolichestvennyi rentgenospektral'nyi fluorestsentnyi analiz [Quantitative X-ray fluorescence analysis]. Moscow, Nauka, 1969. 336 p. (in Russian).
Verigin A.A., Naumik A.I., Madzhara E.O. [The study of the intensity of incoherent scattering on the effective atomic number of complex samples and its use in X-ray analysis]. Trudy V Vserossiiskoi konferentsii po rentgenospektral'nomu analizu [Proceedings of the Fifth All-Russian Conference on X-ray analysis]. Irkutsk, 2006, p. 96 (in Russian).
Mukhanova A.A., Filippov M.N., Kupriianova T.A., Liamina O.N. [Scattering of X-ray radiation in the wavelength ranges of 0.04 - 0.09 nm and 0.3 - 0.8 nm]. Trudy V Vserossiiskoi konferentsii po rentgenospektral'nomu analizu [Proceedings of the Fifth All-Russian Conference on X-ray analysis]. Irkutsk, 2006, p. 14 (in Russian).
Tsvetianskii A.L., Eritenko A.N. [On the value of the effective room environment]. Trudy VII Vserossiiskoi konferentsii po rentgenospektral'nomu analizu [Proceedings of the VII All-Russian Conference on X-ray analysis]. Krasnodar, 2008, p. 127 (in Russian).
Duimakaev Sh.I., Tsvetianskii A.L. [Using scattered primary radiation at X-ray analysis by theoretical correction]. Zavodskaia laboratoriia [Industrial laboratory], 1984, vol. 36, no. 11, pp. 20-24 (in Russian).
Tsvetianskii A.L. Fizicheskie osobennosti realizatsii sposoba standarta-fona pri rentgenospektral'nom analize polikristallicheskikh obraztsov shirokoizmeniaiushchegosia sostava. Diss. kand. fiz.-mat. nauk [Ph.D. phis. and math. sci. diss.]. Rostov-on-Don, 1981. 227 p. (in Russian).
Verigin A.A. Energodispersionnyi rentgenospektral'nyi analiz. Primenenie v promyshlennosti [Energy dispersive X-ray analysis. Industrial Applicability]. Tomsk, Tomsk University, 2005. 242 p. (in Russian).
Alvarez R. P., Van Espen P., Quintana A. A. Assessing scattering effects in annular radioisotope excited. X-ray spectrometry, 2004, vol. 33, no. 1. pp. 74-82.
Latha P., Vinodkumar A.M., Varier K.M., Babu B.R.S., Joseph A., Abdullan K.K., Unnikrishnan M.P. Effective atomic number for gamma ray interaction at 59,54 keV in heterogeneous layers of materials using Am241 gamma rays. Radiation physics and chemistry, 2012, vol. 81, pp. 1817-1822.
Smagunova A.N., Belova R.A., Afonin V.P., Losev N.F. [Method standard background in the X-ray spectral fluorescence analysis]. Zavodskaia laboratoriia [Industrial laboratory], 1964, vol. 30, no. 4, pp. 426-431 (in Russian).
Lenin S.S., Serikov I.V. [X-ray fluorescence analysis of geological samples by standard powder-background using incoherent scatter]. Apparatura i metody rentgenovskogo analiza [Equipment and techniques for X-ray analysis], Leningrad, 1969, no. 4, pp. 161-168 (in Russian).
Bakhtiarov A.V. [Possible ways of standard background in X-ray fluorescence analysis]. Apparatura i metody rentgenovskogo analiza [Equipment and techniques for X-ray analysis.], Leningrad, 1978, no. 21, pp. 3-15 (in Russian).
Bakhtiarov A.V., Nikolaev V.P., Mezhevich A.N. [Study the applicability of the standard method of determining the background at the heavy elements in light media by X-ray fluorescence method]. Apparatura i metody rentgenovskogo analiza [Equipment and techniques for X-ray analysis.], Leningrad, 1974, no. 13, pp. 140-152 (in Russian).
Revenko A.G. Rentgenospectral’nyi fluorestsentnyi analiz prirodnykh materialov [X-Ray Spectral Fluorescence Analysis of Natural Materials]. Novosibirsk, Nauka, 1994. 264 p. (in Russian).
Sukhorukov B.L., Smagunova A.N., Pavlinskii G.V., Losev N.F. [The study of the background in the wavelength region of X-ray fluorescence spectrum]. Zhurnal analiticheskoi himii [Journal of Analytical Chemistry], 1975, vol. 30, no. 2, pp. 372-376 (in Russian).
Bakhtiarov A.V., Blokhin M.A., Meier V.A. [Study background shortwave Cauchois spectrometer using high resolution FPD]. Apparatura i metody rentgenovskogo analiza [Equipment and techniques for X-ray analysis.], Leningrad, 1977, no 19, pp. 118-134 (in Russian).
Pshenichnyi G.A., Meier V.A., Katerinov K.S., Bakhtiarov A.V. [Accounting change of the material composition of complex media with X-ray fluorescence analysis by the method of standard-background]. Apparatura i metody rentgenovskogo analiza [Equipment and techniques for X-ray analysis], Leningrad, 1972, no 10, pp. 121-131 (in Russian).
Konev A.V., Grigor'ev E.V., Astakhova N.A. , Sukhovol'skaia N.E., Rubtsova S.N. [Determination of the background intensity in X-ray analysis of the low content of elements with high atomic numbers and average]. Zhurnal analiticheskoi himii [Journal of Analytical Chemistry], 1985, vol. 40, no. 1, pp. 68-72 (in Russian).
Van Sprang H.A., Bekkers M.H.J. Determination of light elements using X-ray spectrometry. Part 1. Analytical implication of using scattered tube lines. X-ray spectrometry, 1998, vol. 27, no. 1, pp. 31-36.
Van Sprang H.A., Bekkers M.H.J. Determination of light elements using X-ray spectrometry. Part II. Boron in Glass. X-ray spectrometry, 1998, vol. 27, no. 1, pp. 37-42.
Konev A.V., Grigor'ev E.V., Astakhova N.A. , Sukhovol'skaia N.E., Rubtsova S.N. [Optimality criterion instrumental background intensity measurement conditions in X-ray analysis method standard-background]. Zhurnal analiticheskoi himii [Journal of Analytical Chemistry], 1985, vol. 35, no. 3, pp. 407-413 (in Russian).
Garivait S., Quisefit J.P., de Chateaubourg P., Malingre G. Multi-element analysis of plants by WDXRF using the scattered radiation correction method. X-ray spectrometry, 1997, vol. 26, no. 5, pp. 257-264.
Gherase M.R., Fleming D.E.B. Fundamental parameter approach to XRF spectroscopy measurements of arsenic in polyester resin skin phantoms. X-ray spectrometry, 2008, vol. 37, no. 6, pp. 483-489.
Druz' V.V. [Application of the scattered radiation to eliminate the influence of debilitating X-ray properties of samples in determining the contents of a large element]. Tezisy dokladov 10 Vsesoiuznogo soveshchaniia po rentgenovskoi spektroskopii i rentgenospektral'nomu analizu [Abstracts of the X-Union Conference on X-ray spectroscopy and X-ray analysis]. Alma-Ata, 1973, pp. 32 (in Russian).
Zaitsev V.A., Makarova T.A., Barkov A.V., Bakhtiarov A.V. [X-ray fluorescence analysis of ores and their redistribution in the automatic quality control]. Zavodskaia laboratoriia. Diagnostika materialov [Industrial laboratory. Diagnostics of materials], 2007, vol. 73, no. 4, pp. 3-11 (in Russian).
Bakhtiarov A.V., Zaitsev V.A., Makarova T.A. [Multielemental analysis of ores and their products by the method of standard-background using a modified universal equation]. Zhurnal analiticheskoi himii [Journal of Analytical Chemistry], 2007, vol. 62, no. 4, pp. 395-401 (in Russian).
Bakhtiarov A.V. [X-ray fluorescence analysis using scattered radiation]. Zavodskaia laboratoriia. Diagnostika materialov [Industrial laboratory. Diagnostics of materials], 2009, vol. 75, no. 9, pp. 3-11 (in Russian).
Lavrent'ev Iu.G., Kuznetsova A.I. [Constraint equation in X-ray fluorescence analysis]. Zavodskaia laboratoriia. Diagnostika materialov [Industrial laboratory. Diagnostics of materials], 1979, vol. 45, no. 4, pp. 315-326 (in Russian).
Gurvich Iu.M., Kalinin B.D., Mezhevich A.N. [Application of multiple regression in the X-ray analysis]. Apparatura i metody rentgenovskogo analiza [Equipment and techniques for X-ray analysis], Leningrad, 1974, no. 13, pp. 122-128 (in Russian).
Duimakaev Sh.I., Tsvetianskii A.L. [XRF analysis of high contents of elements in the way the standard background]. Zavodskaia laboratoriia. Diagnostika materialov [Industrial laboratory. Diagnostics of materials], 2000, vol. 66, no. 3, pp. 9-12 (in Russian).
Nalimov V.V., Chernova N.A. Statisticheskie metody planirovaniia ekstremal'nykh eksperimentov [Statistical methods for planning of extreme experiment]. Moskow, Science, 1965. 340 p. (in Russian).
Kitov B.I. Instrumental'naia korrektirovka matrichnykh effektov pri ispol'zovanii rentgenospektral'nogo metoda dlia kolichestvennogo analiza khimicheskogo sostava i identifikatsii komponentov veshchestva. Avtoreferat diss. dokt. tekhn. nauk [[Instrumental correction of matrix effects by using X-ray method for the quantitative analysis of chemical composition and identification of the components of matter. Author’s abstract of dr. sci. diss.]. Irkutsk, 2001. 47 p. (in Russian).
Verkhovodov P. Effect of crystal structure on the background intensity in XRF. X-ray spectrometry, 2005, vol. 34, no. 2, pp. 169-171.
Verkhovodov P. Measurement of background components in wavelength dispersive X-ray fluorescence spectrometry. X-ray spectrometry, 2006, vol. 35, no. 5, .pp. 296-304.
Verkhovodov P.A. Rentgenospektral'nyi analiz. Voprosy teorii i sposoby unifikatsii [X-ray analysis. Problems in the theory and methods of unification]. Kiev, Naukova Dumka, 1984. 160 p. (in Russian).
Anderman G., Kemp I.W. Scattered X-ray internal standards in X-ray emission spectrometry. Analytical chemistry, 1958, vol. 30, no. 8, pp. 1306-1309.
Meier V.A., Ivaniukovich G.A., Nakhabtsev V.S., Nakhabtseva V.N., Frolova L.K. [Effect of particle size on X-ray fluorescence analysis of ternary environments]. Apparatura i metody rentgenovskogo analiza [Equipment and techniques for X-ray analysis], Leningrad, 1978, no 20, pp. 161-175 (in Russian).
Shpolianskii A.Ia., Duimakaev Sh.I. [The effect of heterogeneity of the sample in X-ray fluorescence spectrometry]. Deponirovano v VINITI [VINITI], 1982, no. 3664-82, 53 p. (in Russian).
Duimakaev Sh.I., Shpolianskii A.Ia., Zhuravlev Iu.A. [The heterogeneity of the samples analyzed in X-ray fluorescence spectrometry]. Zavodskaia laboratoriia [Industrial laboratory], 1988, vol. 55, no. 12, pp. 24-34 (in Russian).
Smagunova A.N., Ondar U.V., Nikitina V.G., Kozlov V.A. [Study of the dependence of the background intensity in the X-ray fluorescence analysis of the particle size of the radiator], Zhurnal analiticheskoi himii [Journal of Analytical Chemistry], 2001, vol. 56, no. 9, pp. 943-947 (in Russian).
Pavlova T.O., Finkel'shtein A.L., Voronov V.K. [Comparison of options equations method standard background at X-ray fluorescence determination macrocomponents in powder samples]. Zavodskaia laboratoriia. Diagnostika materialov [Industrial laboratory. Diagnostics of materials], 2000, vol. 66, no. 3, pp. 6-9 (in Russian).
Duimakaev Sh.I., Tsvetianskii A.L., Shmytov A.I. [X-ray spectral determination of high content of elements considering the dependence of the scattering coefficient of the chemical composition of the sample]. Deponirovano v VINITI [VINITI], 1978, no. 1680-78, 3 p. (in Russian).
Tsvetianskii A.L. [Theoretical correction method using the intensity of scattered X-rays in the case of a limited number of spectral channels and incomplete information on the composition of calibration sample]. Tezisy dokladov XIII Vsesoiuznogo soveshchaniia po rentgenovskoi i elektronnoi spektroskopii [Abstracts XIII All-Union Conference on X-ray and electron spectroscopy]. Lviv, 1981, p. 78 (in Russian).
Duimakaev Sh.I., Tsvetianskii A.L., Golovko S.A. [Theoretical correction method with a limited number of spectral channels and incomplete information on the composition of the calibration sample]. Deponirovano v VINITI [VINITI], 1980, no. 3623-80, 12 p. (in Russian).
Velichko Iu.I., Kalinin B.D., Mezhevich A.N., Plotnikov R.I., Revenko A.G. [Study of the dependence of values of theoretical corrected of the chemical composition of the samples with x ray analysis of steels]. Zavodskaia laboratoriia [Industrial laboratory], 1977, vol. 43, no. 4, pp. 437-442 (in Russian).
Duimakaev Sh.I., Tsvetianskii A.L. [Using scattered primary radiation at X-ray analysis by theoretical correction]. Zavodskaia laboratoriia. Diagnostika materialov [Industrial laboratory. Diagnostics of materials], 1984, vol. 50, no 11, pp. 20-24 (in Russian).
Eritenko A.N., Tsvetianskii A.L. [Using the primary X-rays in the analysis of solid films]. Referaty dokladov II Mezhdunarodnogo Foruma «Analitika i analitiki» [Abstracts II International Forum "Analytics and analysts"]. Voronezh, 2008, vol. 1, p.134 (in Russian).
Nielson K.K. Progress in X-ray fluorescence correction method using scattered radiation. Advances X-ray analysis, 1979, vol. 22, pp. 303-315.
Kas'ianov P.M. [Accounting matrix effect in X-ray fluorescence analysis of the substance of complex chemical composition]. Zavodskaia laboratoriia. Diagnostika materialov [Industrial laboratory. Diagnostics of materials], 2005, vol. 71, no. 5, pp. 15-19 (in Russian).
Karamanova J. Self-consistent empirical correction for matrix effects in X-ray analysis. Journal of radioanalytical chemistry, 1980, vol. 57, no. 2, pp. 473-479.
Sitko R. Correction of matrix effects via scattered radiation in X-ray fluorescence analysis of samples collected on membrane filters. Journal of Analytical Atomic Spectrometry, 2006, vol. 21, pp. 1062-1067.
Sitko R. Empirical coefficient models for X-ray fluorescence analysis of intermediate-thickness samples. X-ray spectrometry, 2005, vol. 33, no. 1, pp. 11-18.
Ochi H., Watanabe S., Nakamura H. X-ray fluorescence analysis of lead in tin coating using the theoretical intensity of scattered x-rays. X-ray spectrometry, 2008, vol. 37, no. 3, pp. 245-248.
Nielson, K.K. Matrix correction for energy dispersive x-ray fluorescence analysis of environmental samples with coherent/incoherent scattered x-rays. Analytical chemistry, 1977, vol. 49, no. 4, pp. 641-648.
Wegrzynek D., Markowicz A., Chinea-Cano E. Application of the backscatter fundamental parameter method for in situ element determination using a portable energy-dispersive x-ray fluorescence spectrometer. X-ray spectrometry, 2003, vol. 32, no. 3, pp. 245-248.
Szaloki I., Somogyi A., Braun M., Toth A. Investigation of geochemical composition of lake sediments using ED-XFR and ICP-AES techniques. X-ray spectrometry, 1999, vol. 28, no. 5, pp. 399-405.
Dwiggins C. Quantitative determination of low atomic number elements using intensity ratio of coherent to incoherent scattering of X-ray determination of hydrogen and carbon. Analytical chemistry, 1961, vol. 33, no. 1, pp. 67-72.
Kalinin B.D., Plotnikov R.I., Rechinskii A.A. [On the possibility of determining the composition of organic compounds in the intensity of scattered X-rays]. Analitika i kontrol' [Analytics and control], 2011, vol. 15, no. 2, pp. 163-169 (in Russian).]
Smagunova A.N. [Elemental X-ray analysis of organic materials]. Zhurnal analiticheskoi himii [Journal of Analytical Chemistry], 1998, vol. 53, no. 7, pp. 678-690 (in Russian).
Sahin Y., Adem U., Demet D., Mudahin O., Melek. Measurement of soil water using Compton scattering. X-ray spectrometry, 2011. vol. 40, no 4, pp. 315-318.
Araujo M.F., Van Espen P., Van Grieken R. Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation. X-ray spectrometry, 1990. vol. 19, no. 5, pp. 29-33.
Giauque R.D. A novel method to ascertain sample mass thickness and matrix effects for X-ray fluorescence element determinations. X-ray spectrometry, 1994. vol. 23, no. 5, pp. 160-168.
Ссылки
- На текущий момент ссылки отсутствуют.